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During any Analog Mixed Signal project we required HDL Simulator to simulate Digital portion of design and Analog Circuit simulator for Analog design. If Method 2 is AMSVM Phase- 1 and Analog Behavioral model is designed using HDL languages like Verilog /VHDL. There is no additional cost in project for tools. There may be a question arising when same verification results can be achieved using both methods shown in AMSVM Phase -1, then why 2 methods are described. It is true that results achieved are same, but with Method1 it takes less verification effort/time to achieve those results. So depending on project schedule and cost, it can be decided whether to use Method1 or Method2.
Analog Mixed Signal Verification Methodology (AMSVM) is basically divided into 4 different phases. Each Verification phase targets specific areas of Analog Mixed Signal Design Flow as shown in Figure 1.
Above points show few holes or missing links seen during Analog Mixed Signal Verification. Now the question is why logic equivalence checks are needed between Analog circuit simulation and functional behavioral models. The need is, unlike digital design where RTL design used for verification is source of actual design, Analog behavioral model used for verification is not source of actual design and the Analog circuit design used as source for actual design is not verified functionally.
Methodology or flow proposed in this paper addresses above discussed missing holes or links seen in other various methodologies.
AMSVM PHASE-1: verification was done by developing model to test all analog signals using signature values and System Verilog Assertions (SVA) to check connectivity and combinational logic. AMSVM PHASE- 2: Functional verification was done using CDV (Coverage Drive Verification) approach. Functional environment was developed using reusable UVM methodology.
There are a few different methods that can be used to ensure high quality code in a large testbench. One is to use a code coverage tool to measure the percentage of the code that is being covered by the tests. Another is to use a linting tool to check for potential errors. Finally, it is also important to have a robust suite of regression tests that can be run regularly to catch any potential issues.
Constrained random testing is a method of functional verification in which test vectors are generated randomly, but with certain constraints in place in order to ensure that all areas of the design are covered. This type of testing can be used to verify the functionality of digital designs, as well as analog and mixed-signal designs.
There are a few key factors to keep in mind when designing functional tests for a chip. First, you need to make sure that the tests you create are comprehensive and cover all of the functionality of the chip. Second, you need to make sure that the tests are repeatable and consistent, so that you can verify the results. Finally, you need to make sure that the tests are efficient, so that they can be run in a timely manner.
Yes, there are a few key differences. First, automotive ICs are subject to much more stringent quality and reliability requirements than other kinds of chips. This means that the functional verification process for automotive ICs must be much more thorough and comprehensive. Additionally, automotive ICs are often required to operate in extreme conditions, such as high temperatures and humidity levels. This means that the functional verification process must take these conditions into account and test for them specifically.
Yes, there are a few common debugging techniques used in functional verification. One is called “coverage analysis,” which helps you to identify which parts of the design have been tested and which have not. Another is called “assertion checking,” which allows you to check that certain conditions are being met by the design. Finally, “testbench automation” can help to speed up the process of running and re-running tests.